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Electronic Systems, Circuits and Devices Research

Electronic Systems, Circuits and Devices Research at KU

KU carries out innovative fundamental and applied research in mixed signal and system on chip semiconductor circuits and systems.

Our mission is to create knowledge and educate highly skilled engineers and entrepreneurs to encourage, promote and enable job creation in semiconductor related sectors and build a strategic national capacity in semiconductors and nanotechnology.

Research staff

Dr. Mohammed Ismail Elnagger

Professor

Dr. Abdel Isakovic

Associate Professor

Dr. Baker Mohammed

Associate Professor

Dr. Moh'd Rezeq

Associate Professor

Dr. Hani Saleh

Assistant Professor

Dr. Shakti Singh

Assistant Professor

Dr. Nazar Ali

Associate Professor

Dr. Kahtan Mezher

Associate Professor

 

  • SoC Design, validation and test
  • Biomedical Algorithm developments and realization
  • SoCs for the Internet of Things
  • RF and mm-wave Chip Design
  • Mixed signal Chip Design
  • Embedded Systems
  • Memristor design
  • Energy harvesting and power management
  • Nanotechnology , beyond CMOS
  • Integrated sensors
  • Y. Halawani, B. Mohammad, D. Homouz, M. Al-Qutayri, and H. Saleh, “Modeling and optimization of memristor and STT-RAM-based memory for low-power applications,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 24, no. 3, pp. 1003-1014, 2016.
  • N. Bayasi, T. Tekeste, H. Saleh, B. Mohammad, A. Khandoker, and M. Ismail, “Low-Power ECG-Based Processor for Predicting Ventricular Arrhythmia,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 24, no. 5, pp. 1962-1974, 2016 .
  • M. Rezeq, A. Ali, and H. Barada, “Modeling of nanotips fabricated by local electron bombardment,” IEEE Transactions on Nanotechnology, vol. 15, no. 3, pp. 367-372, 2016
  • F. Adly, O. Alhussein, P. D. Yoo, Y. Al-Hammadi, K. Taha, S. Muhaidat, Y. -S. Jeong, U. Lee, and M. Ismail, “Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps,” IEEE Transactions on Industrial Informatics, vol. 11, no. 6, pp. 1267-1276, 2015.
  • B. S. Mohammad, H. Saleh, and M. Ismail, “Design Methodologies for Yield Enhancement and Power Efficiency in SRAM-Based SoCs,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 23, no. 10, pp. 2054-2064, 2015.
  • B. Mohammad, “Embedded memory interface logic and interconnect testing,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 23, no. 9, pp. 1946-1950, 2015.
  • F. Adly, P. D. Yoo, S. Muhaidat, Y. Al-Hammadi, U. Lee, and M. Ismail, “Randomized general regression network for identification of defect patterns in semiconductor wafer maps,” IEEE Transactions on Semiconductor Manufacturing, vol. 28, no. 2, pp. 145-152, 2015.
  • S. Bou-Sleiman, and M. Ismail, “Dynamic self-regulated charge pump with improved immunity to PVT variations,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22, no. 8, pp. 1716-1726, 2014.